Enterprise services:

EMC testing services

EMC testing services provide assessments of the electromagnetic compatibility of electronic devices. Testing ensures that devices operate reliably and safely in environments with electromagnetic interference. EMC testing includes a wide range of tests to evaluate a device’s ability to emit and withstand electromagnetic radiation. This testing is crucial for devices to meet international EMC standards and certifications, which are often required for commercial use.

 

To whom:

  • EMC testing services are generally suitable for all electronics companies in Finland that design, manufacture, and/or market electronic devices.

Final result:

  • Reliable measurement results and a test report.

 Testing the electromagnetic compatibility of electrical and electronic devices

Tests

 

  • Radiated radio frequency interference: 30 MHz – 2.0 GHz
  • Conducted emissions: 9 kHz – 30 MHz
  • Radio frequency field immunity test: 80 MHz – 3 GHz, maximum field strength 10 V/m (EN 61000-4-3)
  • Conducted RF immunity test: 150 kHz – 80 MHz (230 MHz) (EN 61000-4-6)
  • Electrostatic discharge (ESD) immunity test (EN 61000-4-2)
  • Electrical fast transient (EFT) and burst immunity test (EN 61000-4-4)
  • Surge voltage immunity test (EN 61000-4-5)
  • Magnetic field immunity test (EN 61000-4-8, -9)
  • Tests can also be performed on three-phase devices.
Radio anechoic test chamber
  • Maximum dimensions of the device under test: 500 x 500 x 500 mm (50 kg)
  • Shielded measurement room dimensions: 7.4 m x 3.2 m x 3.3 m
  • Inspection measurements by Austria Research Center (EUROSHIELD OY, 09/02)
Testing equipment
  • Measurement receiver: ESU, 20 Hz – 26.5 GHz, R&S; Bilog antenna: 30 MHz – 2.5 GHz, Chase
  • Horn antenna: ETS3115, 750 MHz – 18 GHz, ETS
  • Artificial network: ESH2-Z5, 9 kHz – 30 MHz, R&S
  • Absorbing clamp: MDS-21, 30 – 1000 MHz, Luthi
  • Spectrum analyzer: FSP, 9 kHz – 30 GHz, R&S; Current probe: EZ-17, 20 Hz – 100 MHz (200 MHz), R&S
  • Close field probe: HP 11940 A, 9 kHz – 30 MHz, HP
  • Close Field Probe HP 11941 A, 30 MHz – 1 GHz, HP
  • Signal generator: SME 03, 5 kHz – 3 GHz, R&S; Amplifier: 714FC-CE, 20-1000 MHz, 30 W, Kalmus
  • Amplifier: 275LC-CE, 0.01 – 220 MHz, 75 W, Kalmus
  • Amplifier: 5081G4A, 0.80 GHz – 4.2 GHz, 50 W, AR
  • CDN M1, M2, M3 S9, Luthi
  • EM Clamp KEMZ 801, Schaffner
  • Injection clamp, LuthiSurge -testeri PSURGE 4010, 0,2 – 4,2 kV, 1-phase, Haefely – Trench
  • Coupling filter FP-SURGE 32.1, 3-phase, max. 32 A, Haefely – Trench
  • Coupling network IP 6.2, Haefely – Trench
  • EFT/Burst -testeri PEFT Junior, 0,22 – 4,5 kV, 1-phase, Haefely – Trench
  • Coupling filter FP-EFT 32.1, 3-phase, max. 32 A, Haefely – Trench
  • Capacitive coupling device IP 4A, Haefely – Trench
  • ESD simulator PESD 1600, 0.2 – 16.5 kV (air), 0.2 – 9.0 kV (contact), Haefely – Trench
  • Power Frequency Test System PHF 555, 1-phase, Haefely – Trench
  • Power frequency magnetic field immunity tester MAG 100.1 with 1m x 1m coil, Haefely – Trench
  •  Pulsed magnetic field immunity tester 1m x 1m coil, Haefely – Trench

Contact

Sami Korpiniemi

Laboratory engineer: Technology
sami.korpiniemi@vamk.fi
+358 207 663 443

Seppo Mäkinen

Principal Lecturer: Technology
seppo.makinen@vamk.fi
+358 207 663 388